Hehong Fan

发布者:陈国华发布时间:2014-10-26浏览次数:763

Basic Information  
Hehong Fan
Tel:86-25-83792469-8303
Email:fhh@seu.edu.cn
Address:School of Electronic Science and Engineering, , SEU,Sipailou 2, Nanjing
 
Research Interest

Her research topics include reliability evaluation of communication/sensor networks and complex systems; network failure detection, localization, and restoration; restorable optical access network architecture design; reliability analysis of vacuum electronic devices and photonic devices.
Recent Research Project:
Reliability evaluation for vacuum electronic devices under varying stress conditions.
Key techniques for wideband high-speed TOSA
Key technologies in asynchronous optical packet switching distributed control node
Failure prediction for wireless sensor networks in practical application environments
Study for key technologies in network reliability allocation and verification

 
Biographical Information

Hehong Fan was born in China in 1977. She received her B.E. in Physical Electronics & Optical Electronics and her B.S. in Science of Computation from Xi’an Jiaotong University, Xi’an, China, and her M.E. and Ph.D. degrees in Physical Electronics from Southeast University, Nanjing, China, in 1998, 2003, and 2011, respectively.
From 1998 to 2000, she was with the National Platform Display Center in Nanjing Electronic Devices Institute, Nanjing, China. She joined Southeast University in 2003, where since then she has been involved in research on reliability analysis of electronic devices, complex systems and networks. She is currently an associate professor in School of Electronic Science and Engineering, in Southeast University.

 
Selected Publications

1.Hehong Fan, Jianqing Li, and Xiaohan Sun. Cost-Effective Scalable and Robust Star-Cross-Bus PON Architecture Using a Centrally Controlled Hybrid Restoration Mechanism. J. Opt. Commun. Netw. 2013, 5(7): 730-740
2.Fan Hehong, Sun Xiaohan. A multi-state reliability evaluation model for P2P networks, Reliability Engineering and System Safety, 2010, 95(4): 402-411
etc.